Application of lateral shearing interferometry to 'stochastic inputs*

Lateral shearing interferometry is a simple and accurate method of measuring the shape of an optical wave front. However, the complex mathematics required in reduction of the interferograms has limited the adoption of this interferometric technique. A data reduction technique using Fourier analysis methods has been developed which makes lateral shearing interferogram reduction more flexible. This technique is hypothetically applied to the measurement of wave fronts propagating simplicity and accuracy of this data reduction method.